Information Package / Course Catalogue
| Course Code | : FZK617 |
| Course Type | : Area Elective |
| Couse Group | : Third Cycle (Doctorate Degree) |
| Education Language | : Turkish |
| Work Placement | : |
| Theory | : 3 |
| Prt. | : 0 |
| Credit | : 3 |
| Lab | : 0 |
| ECTS | : 8 |
Provide an understanding of the basic principles of the ellipsometry method and polarization states of light
To examine Jones matrix formulation which define to propagation of polarized light through polarizing optical systems and states of polarization of light. Elipsometric measurement techniques are used to determine the optical properties of thin films.
| 1. | To be able to describe the polarization states of light. |
| 2. | To be able to describe the any polarization state of a polarized wave of light propagation through the optical systems |
| 3. | To be able to use the technique of ellipsometry in determining the optical properties of thin films |
| 4. | To be able to understand the null ellipsometry technique and to be able to apply it |
| 5. | To be able to construct the relation between the ellipsometry and the other branches of physics |
| 1. | Ellipsometry and Polarized Light. R.M.A. Azzam |
| 2. | Polarized light and optical measurement. David Clarke, John Fraser Grainger |
| 3. | Field guide to polarization. Edward Collet |
| 4. | Handbook of ellipsometry. Harland G. Tompkins, Eugene A Irene |
| Type of Assessment | Count | Percent |
|---|---|---|
| Midterm Examination | 1 | %30 |
| Final Examination | 1 | %70 |
| Activities | Count | Preparation | Time | Total Work Load (hours) |
|---|---|---|---|---|
| Lecture - Theory | 14 | 6 | 3 | 126 |
| Midterm Examination | 1 | 7 | 7 | 14 |
| Final Examination | 1 | 44 | 11 | 55 |
| TOTAL WORKLOAD (hours) | 195 | |||
PÇ-1 | PÇ-2 | PÇ-3 | PÇ-4 | PÇ-5 | PÇ-6 | PÇ-7 | PÇ-8 | |
OÇ-1 | 5 | 4 | 4 | 3 | 3 | 4 | 2 | 4 |
OÇ-2 | 5 | 5 | 4 | 4 | 3 | 4 | 3 | 3 |
OÇ-3 | 4 | 4 | 4 | 3 | 2 | 3 | 4 | 4 |
OÇ-4 | 4 | 4 | 4 | 3 | 3 | 3 | 3 | 3 |
OÇ-5 | 4 | 5 | 5 | 4 | 4 | 3 | 3 | 3 |